Global Patent Examination Information Added to SIPO’s CPQUERY

The SIPO has added the Global Patent Examination Information into the China Patent Examination Inquiry Platform (http://cpquery.sipo.gov.cn/), so as to meet the inquiry demand of public users and examiners on such information.

As of May 18 2015, by inputting application number, publication number and priority number, patent family information of the application, examination information of the inventions filed before European Patent Office (EPO), Japan Paten Office (JPO), Korea Intellectual Property Office (KIPO), and SIPO, can be retrieved. Such information of U.S. Patent and Trademark Office (USPTO) will be incorporated to the platform in June.

(Source: SIPO)